Hasegawa Group Hasegawa Group
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2003年学会発表

International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (Eindhoven, 7月)

タイトル 発表者
STM/STS observations of Impurities in High-Tc Superconductor Bi2Sr2CaCu2Oy Single Crystals G. Kinoda1, H. Mashima1, S. Nakao2, K. Shimizu2, J. Shimoyama2, K. Kishio2, T. Hanaguri2, K. Kitazawa2, T. Hasegawa1
1Frontier Collaborative Research Center, Tokyo Institute of Technology, 2Department of Applied Chemistry, University of Tokoy
Material dependence of vortex pining states in high-Tc superconductors probed by scanning SQUID microscopy J. Kasai1, X. Zhao2, N. Okazaki2, Y. Nakayama3, Y. Togawa3, T. Sasagawa3, M. Ohtani4, T. Fukumura4, J. Shimoyama3, K. Kishio3, M. Kawasaki4, H. Koinuma2,5, T. Hasegawa1,2,5
1FCRC, Tokyo Institute of Technology, 2Advanced Materials Lab., National Institute for Materials Science, 3Department of Superconductivity, Univ. of Tokyo, 4IMR, Tohoku University, 5MSL, Tokyo Institute of Technology
Variable temperature magnetic probe microscopy under external magnetic field H. Sugaya1, X. J. Fan2, J. Nishimura3, T. Fukumura3, M. Kawasaki3, H. Koinuma4, T. Hasegawa1
1Frontier Collaborative Research Center, Tokyo Institute of Technology, 2Dept. of Materials Science and Engineering, University of Science and Technology of China, 3Institute for Materials Research, Tohoku University, 4Materials and Structures Laboratory, Tokyo Institute of Technology
Local electronic structure of heavily Pb-doped Bi2Sr2Cu2Oy single crystal H. Mashima1, G. Kinoda1, T.Kondo2, H. Ikuta3, T. Hasegawa1
1FCRC, Tokyo Institute of Technology, 2Dept. Crystalline Materials Science, Nagoya University, 3Center for Integrated Research in Science and Engineering, Nagoya University
Development of Scanning Microwave Microscope for Low-Temperature Measuremen S.Okazaki1, N.Okazaki2, H. Sugaya1, J. Nishimura3, T. Fukumura3, M. Kawasaki3, H.Koinuma4, T.Hasegawa1,4
1Frontier Collaborative Research Center, Tokyo Institute of Technology, 2National Institute for Materials Science, 3Institute for Materials Research, Tohoku University, 4Materials and Structure laboratory, Tokyo Institute of Technology
Local magnetic properties of pyrochlore oxide Sm2Mo2O7 probed by scanning SQUID microscopy T.Suenaga, X.-J. Fan, X.-R. Zhao, H. Koinuma1, M. Kawasaki2, T. Fukumura2, T.Hasegawa
FCRC, Tokyo Inst. of Tech., 1MSL, Tokyo Inst. of Tech, 2IMR, Tohoku Univ.

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2003年秋季 応用物理学会学術講演会 (福岡大学 七隈キャンパス, 9月)

タイトル 発表者
高濃度Pb置換Bi2212における不純物周囲の局所超伝導特性評価 木野田剛1, 眞嶋秀樹2, 中尾祥一郎3, 清水圭輔3, 花栗哲郎3, 北沢宏一3,4, 下山淳一3,4, 岸尾光二3,4, 長谷川哲也2,3,4
物材機構1, 東工大フロンティア2, 東大院3, 科技団4
面内磁化(Ga,Mn)As薄膜にけるcharged domain構造の走査SQUID顕微鏡観察 稲葉和久1, 福村知昭2, 鯉沼秀臣3,4, 千葉大地5, 篁耕司5, 松倉文礼5, 大野英男5, 長谷川哲也1,4,6
東工大フロンティア1, 東北大金研2, 東工大応セラ研3, 物質・材料研究機構4, 東北大通研5, 東大理6
走査型SQUID顕微鏡によるNd0.7Ca0.3MnO3単結晶の局所磁性観察 菅谷英生1, 范暁娟2, 鯉沼秀臣3, 長谷川哲也1,4
東工大フロンティア1, 中国科技大2, 東工大応セラ研3, 東大院理4
誘電・導電材料の低温における高速評価を目的とした走査型マイクロ波顕微鏡の開発 岡崎壮平1, 岡崎紀明2, 菅谷英生1, 西村潤3, 福村知昭3, 川崎雅司3, 鯉沼秀臣2,4,5, 長谷川哲也1,2,6
東工大フロンティア1, 物質・材料研究機構2, 東北大金研3, 東工大応セラ研4, 科技団戦略5, 東大理6

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日本物理学会 2003年秋季大会 (岡山大学 津島キャンパス, 9月)

タイトル 発表者
高濃度Pb置換Bi2201単結晶の低温STM/STSⅢ 眞嶋秀樹A, 木野田剛A, 近藤猛B, 生田博志C, 長谷川哲也A
東工大フロンティアA, 名大工B, 名大理工総研C
走査型SQUID顕微鏡を用いたパイロクロア型モリブデン酸化物の磁区構造観察 末永智郁, 范暁娟, 趙小如, 鯉沼秀臣1, 川崎雅司2, 福村知昭2, 長谷川哲也3
東工大フロンティア, 東工大応セラ研1, 東北大金研2, 東大理3

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IUMRS International Conference on Advanced Materials 2003 (The 8th IUMRS International Conference on Advanced Materials) (Yokohama, Oct)

タイトル 発表者
Developments of High-throughput Characterization Tools for Combinatorial Libraries in Thin Film Form T. Hasegawa1,2, N. Okazaki2, X. Zhao2, M. Nagano2, H. Koinuma1,2
1Tokyo Institute of Technology, Japan, 2National Institute foe Materials Science, Japan
Quantitative Characterization of Combinatorial Dielectric Thin Films by the Scanning Microwave Microscope N. Okazaki1, S, Okazaki2, H. Higuma3, S. Miyashita3, Y. Cho4, J. Nishimura4, T. Fukumura4, M. Kawasaki1,4, M. Murakami2, K. Hasegawa2, P. Ahmet1, T. Chikyow1, Y. Yamamoto2, Y. Matsumoto2, H. Koinuma1,2, T. Hasegawa1,2
1National Institute for Materials Science, 2Tokyo Institute of Technology, 3Mitsubishi Electric Corporation, 4Tohoku University
A New Magneto-Optical Characterization Tool for Combinatorial Libraries X. R. Zhao1, N. Okazaki1, Y. Konishi2, K. Akahane2, Z. Kuang3, T. Ishibashi3, K. Sato3, H. Koinuma1,4 T. Hasegawa1,4
1National Institute for Materials Science, Japan, 2Neoark Corporation, Japan, 3Tokyo University of Agriculture and Technology, Japan, 4Tokyo Institute of Technology
Electronic Structures of Impurities in Heavily Pb-Doped Bi2Sr2CaCu2Oy Single Crystals Probed by Cryogenic STM/STS G. Kinoda, H. Mashima1, S. Nakao2, K. Shimizu2, J. Shimoyama2,3, K. Kishio2,3, T. Hanaguri2,3, K. Kitazawa2,3, T. Hasegawa1,2,3
NIMS,Japan, 1FCRC, Tokyo Institute of Technology, Japan, 2University of Tokyo, Japan, 3SORST, JAPAN
Combinatorial Characterizations of Photo-induced Magnetism in Perovskite-type Mn oxides by Scanning SQUID Microscopy H. Sugaya1, J. Nishimura2, T. Fukumura2, M. Kawasaki2, H. Koinuma1, Y. Tokura3, T. Hasegawa1
1Tokyo Institute of Technology, Japan, 2Tohoku University, Japan, 3University of Tokyo, Japan
Scanning Tunneling Spectroscopy of heavily Pb doped Bi2Sr2CuO6+δ H. Mashima4, G. Kinoda1, T. Kondo2, H. Ikuta3, T. Hasegawa4
1NIMS, Japan, 2Dept Crystalline Materials Science, Nagoya University, Japan, 3Center for Integrated Research in Science and Engineering, Nagoya University, Japan, 4Tokyo Institute of Techonology, Japan
Development of Scanning Microwave Microscope for Fast Characterization of Dielectric and Conducting Materials at Low Temperatures S. Okazaki1, N. Okazaki2, H. Sugaya1, J. Nishimura3, T. Fukumura3, M. Kawasaki3, H. Koinuma1, T. Hasegawa1,2
1Tokyo Institute of Technology, 2National Institute for Materials Science, 3Tohoku University

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2003 MRS Fall Meeting (Boston, 12月)